The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2015

Filed:

Jun. 19, 2012
Applicants:

Hang Kee Kim, Daejeon-si, KR;

Chang Joon Park, Daejeon-si, KR;

Inventors:

Hang Kee Kim, Daejeon-si, KR;

Chang Joon Park, Daejeon-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01); H04L 12/26 (2006.01); H04L 12/24 (2006.01);
U.S. Cl.
CPC ...
H04L 43/04 (2013.01); H04L 43/50 (2013.01); H04L 41/064 (2013.01);
Abstract

The test analysis system of a network according to an exemplary embodiment of the present invention includes: a server group having at least one server performing at least any one of generation of real-time information and storage of a server local log according to test scenarios; a client group having at least one client. communicating with the server group and performing at least any one of the generation of the real-time information and the storage of the local log according to the test scenarios; and a monitoring system storing the real-time information as a system log while monitoring the real-time information received from the server group and the client group during the execution of the test scenarios and informing a test manager of the monitored real-time information.


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