The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2015
Filed:
Aug. 09, 2010
Antonio Robles-kelly, Kaleen, AU;
Cong Phuoc Huynh, Braddon, AU;
Antonio Robles-Kelly, Kaleen, AU;
Cong Phuoc Huynh, Braddon, AU;
National ICT Australia Limited, Eveleigh, NSW, AU;
Abstract
The disclosure concerns processing of electronic images, such as hyperspectral, multispectral or trichromatic images. In particular, but is not limited to, a method, software and computer for estimating parameters of a reflectance model applied to an image is disclosed. Examples of processing of the images using the estimated parameters includes material recognition, re-coloring and re-shading of objects represented in the image. That is, a computer implemented method is provided of estimating one or more of photogrammetric parameters,surface shapeand index of refractionrepresented in a reflectance image having one or more known illumination directionsand a known viewing direction, the method comprising optimizing () the difference between the reflectance image and a reflectance model, the reflectance model being based on surface shape; the material index of refractionand a set of photogrammetric parameters.