The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2015

Filed:

Aug. 22, 2012
Applicants:

Apostolos Lerios, Austin, TX (US);

Ryan David Mack, Waltham, MA (US);

Inventors:

Apostolos Lerios, Austin, TX (US);

Ryan David Mack, Waltham, MA (US);

Assignee:

Facebook, Inc., Menlo Park, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G09G 5/02 (2006.01); G06T 3/00 (2006.01); H04N 1/60 (2006.01); H04N 1/54 (2006.01);
U.S. Cl.
CPC ...
G06T 3/00 (2013.01); H04N 1/6058 (2013.01); H04N 1/54 (2013.01);
Abstract

Techniques for accurate color representation of images stored within a social networking system. In an embodiment, an error metric and a target error threshold are determined. A binary search algorithm and a simulated annealing algorithm are performed. A color profile for transforming an image in a first color space to a second color space is created based on the binary search algorithm, the simulated annealing algorithm, the error metric, and the target error threshold. Determination of the error metric may comprise determining a frequency with which a color occurs in the image, assigning a weight to the color based on the frequency, and calculating the error metric based on the weight. Determination of the error metric may comprise dividing the image into a plurality of sections, assigning a plurality of importance values to the plurality of sections, and calculating the error metric based on the plurality of importance values.


Find Patent Forward Citations

Loading…