The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2015
Filed:
Sep. 03, 2013
Harris Corporation, Melbourne, FL (US);
Mac L. Hartless, Forest, VA (US);
Richard D. Taylor, Moneta, VA (US);
Steve R. Wynn, Lynchburg, VA (US);
Harris Corporation, Melbourne, FL (US);
Abstract
Symbol sampling in a high time delay spread interference environment includes acquiring () a time varying baseband waveform. The waveform has a signal amplitude that varies between one of a plurality of symbol states. The waveform is sampled () at a rate of m times the symbol rate. During an evaluation time, an error value is calculated () for each of m data sample positions. Each of the error values comprises an average distance between the measured value of the waveform as indicated by the data sample and a closest known symbol value. The error values are used to create an error surface. Thereafter, the error surface is modeled as a quadratic and an optimal sample time is determined () based on finding the time location where the quadratic surface is minimum. A sinc interpolator is then used to resample the data.