The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2015

Filed:

Jun. 08, 2012
Applicants:

Shu Yuen Wu, Hong Kong, CN;

Ho Pui Ho, Hong Kong, CN;

Chi-man Lawrence Wu, Hong Kong, CN;

Siu-pang NG, Hong Kong, CN;

Inventors:

Shu Yuen Wu, Hong Kong, CN;

Ho Pui Ho, Hong Kong, CN;

Chi-man Lawrence Wu, Hong Kong, CN;

Siu-pang Ng, Hong Kong, CN;

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical sensing device including a source unit configured to generate a polychromatic light beam containing p-polarized beam and s-polarized beam; an interferometric unit configured to introduce birefringent retardation for generating optical path difference between the p-polarized beam and the s-polarized beam; a SPR sensing unit configured to receive both p-polarized beam and s-polarized beam and induce a SPR effect to the p-polarized beam associated with a target sample; and a detection unit for detecting target sample characteristics by obtaining an interference spectrum of the p-polarized beam and the s-polarized beam from the SPR sensing unit.


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