The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2015
Filed:
Feb. 14, 2011
Alfred Feitisch, Los Gatos, CA (US);
Lutz Keller, Fontana, CA (US);
Xiang Liu, Rancho Cucamonga, CA (US);
Mathias Schrempel, Alta Loma, CA (US);
Keith Benjamin Helbley, Riverside, CA (US);
Alfred Feitisch, Los Gatos, CA (US);
Lutz Keller, Fontana, CA (US);
Xiang Liu, Rancho Cucamonga, CA (US);
Mathias Schrempel, Alta Loma, CA (US);
Keith Benjamin Helbley, Riverside, CA (US);
SpectraSensors, Inc., Rancho Cucamonga, CA (US);
Abstract
Light intensity data quantifying intensity of light generated by a light source and received at a detector during a validation mode of an absorption spectrometer can be compared with a stored data set representing at least one previous measurement in a validation mode of an analytical system. The validation mode can include causing the light to pass at least once through each of a zero gas and a reference gas contained within a validation cell and including a known amount of a target analyte. The zero gas can have at least one of known and negligible first light absorbance characteristics within a range of wavelengths produced by the light source. A validation failure can be determined to have occurred if the first light intensity data and the stored data set are out of agreement by more than a predefined threshold amount. Related systems, methods, and articles of manufacture are also described.