The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2015

Filed:

Sep. 02, 2010
Applicants:

Danny S. Moshe, Kiryat Ono, IL;

Henry M. Dante, Midlothian, VA (US);

Seetharama C. Deevi, Midlothian, VA (US);

Curtis M. Hinton, Glen Allen, VA (US);

Inventors:

Danny S. Moshe, Kiryat Ono, IL;

Henry M. Dante, Midlothian, VA (US);

Seetharama C. Deevi, Midlothian, VA (US);

Curtis M. Hinton, Glen Allen, VA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/00 (2006.01); B07C 5/342 (2006.01); G01N 21/85 (2006.01); G01N 21/84 (2006.01);
U.S. Cl.
CPC ...
B07C 5/3422 (2013.01); G01N 21/85 (2013.01); G01N 2021/845 (2013.01); G01N 2021/8466 (2013.01);
Abstract

A system for grading an agricultural product employing hyper-spectral imaging and analysis. The system includes at least one light source for providing a beam of light, an interferometer or a prism array for dispersing electromagnetic radiation emitted from said agricultural product into a corresponding spectral image, a light measuring device for detecting component wavelengths within the corresponding spectral image and a processor operable to compare the detected component wavelengths to a database of previously graded agricultural products to identify and select a grade for the agricultural product. A method for grading an agricultural product via hyper-spectral imaging and analysis is also provided.


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