The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2015

Filed:

Aug. 10, 2010
Applicants:

Michael R. Feldman, Huntersville, NC (US);

James E. Morris, Lake Wylie, SC (US);

Robert D. Tekolste, Charlotte, NC (US);

Inventors:

Michael R. Feldman, Huntersville, NC (US);

James E. Morris, Lake Wylie, SC (US);

Robert D. TeKolste, Charlotte, NC (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/225 (2006.01); G02B 9/12 (2006.01); G02B 13/00 (2006.01); H01L 27/146 (2006.01);
U.S. Cl.
CPC ...
G02B 9/12 (2013.01); G02B 13/003 (2013.01); G02B 13/0035 (2013.01); G02B 13/006 (2013.01); G02B 13/0085 (2013.01); H01L 27/14625 (2013.01); H01L 27/14685 (2013.01); H04N 5/2254 (2013.01); H04N 5/2257 (2013.01);
Abstract

A camera system may include an optics stack including two substrates, the optics stack forming an imaging system, each substrate having two surfaces that are parallel to each other and perpendicular to an optical axis of the imaging system, the optics stack including a securing region on opposing surfaces of the two substrates, the two substrates being secured together on a wafer level at their respective securing regions, at least one of the surfaces of the two substrates including a refractive surface of the imaging system, a detector substrate having an active area and a cover structure protecting at least the active area of the detector substrate, the optics stack being secured to an upper surface of the cover structure.


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