The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2015
Filed:
Oct. 14, 2011
Jiaping Wang, Beijing, CN;
Baining Guo, Beijing, CN;
Peiran Ren, Beijing, CN;
John Michael Snyder, Redmond, WA (US);
Xin Tong, Beijing, CN;
Jiaping Wang, Beijing, CN;
Baining Guo, Beijing, CN;
Peiran Ren, Beijing, CN;
John Michael Snyder, Redmond, WA (US);
Xin Tong, Beijing, CN;
Microsoft Corporation, Redmond, WA (US);
Abstract
A system for reflectance acquisition of a target includes a light source, an image capture device, and a reflectance reference chart. The reflectance reference chart is fixed relative to the target. The light source provides a uniform band of light across at least a dimension of the target. The image capture device is configured and positioned to encompass at least a portion of the target and at least a portion of the reflectance reference chart within a field-of-view of the image capture device. The image capture device captures a sequence of images of the target and the reflectance reference chart during a scan thereof. Reflectance responses are calculated for the pixels in the sequence of images. Reference reflectance response distribution functions are matched to the calculated reflectance responses, and an image of the target is reconstructed based at least in part on the matched reference reflectance response distribution functions.