The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2015

Filed:

Dec. 27, 2011
Applicants:

Kwang-hyuk Bae, Seoul, KR;

Kyu-min Kyung, Seoul, KR;

Tae-chan Kim, Yongin-si, KR;

Inventors:

Kwang-Hyuk Bae, Seoul, KR;

Kyu-Min Kyung, Seoul, KR;

Tae-Chan Kim, Yongin-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/02 (2006.01); G01S 7/486 (2006.01); G01S 17/02 (2006.01); G01S 17/89 (2006.01);
U.S. Cl.
CPC ...
H04N 13/0253 (2013.01); G01S 7/4861 (2013.01); G01S 17/023 (2013.01); G01S 17/89 (2013.01);
Abstract

An image processing system includes a calculation unit, a reconstruction unit, a confidence map estimation unit and an up-sampling unit. The up-sampling unit is configured to perform a joint bilateral up-sampling on depth information of a first input image based on a confidence map of the first input image and a second input image with respect to an object and increase a first resolution of the first input image to a second resolution to provide an output image with the second resolution.


Find Patent Forward Citations

Bae, Kwang-Hyuk. (2015). Image processing systems for increasing resolution of three-dimensional depth data (U.S. Patent No. 8953021). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8953021

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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