The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2015

Filed:

Feb. 13, 2012
Applicants:

Darin Williams, Tucson, AZ (US);

Kent P. Pflibsen, Tucson, AZ (US);

Marc Berte, Ashburn, VA (US);

Inventors:

Darin Williams, Tucson, AZ (US);

Kent P. Pflibsen, Tucson, AZ (US);

Marc Berte, Ashburn, VA (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/00 (2011.01);
U.S. Cl.
CPC ...
Abstract

Embodiments of a multi-plenoptic system with image stacking and method for wide field-of-regard (FOR) high-resolution image are generally described herein. The multi-plenoptic system may include a subfield separator to decompose an image within a wide field of view into a plurality of multi-pixel subfields. The subfield separator may rotate a chief ray within each multi-pixel subfield by a differing amount relative to a rotation of other rays of the subfield. The multi-plenoptic system may also include a subfield modulator to selectively block or pass light from at least a portion of one or more of the subfields and a subfield image formation element to relay the portions of the subfields that are passed by the subfield modulator onto substantially overlapping areas of a common image plane. A single focal-plane array (FPA) may be aligned with the common image plane to provide for high-resolution imaging over a wide FOR.


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