The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2015

Filed:

Jul. 21, 2014
Applicant:

Pmc-sierra Us, Inc., Sunnyvale, CA (US);

Inventor:

Anthony Eugene Zortea, Pipersville, PA (US);

Assignee:

PMC-Sierra US, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/08 (2006.01);
U.S. Cl.
CPC ...
H03M 1/0836 (2013.01); H03M 1/0809 (2013.01);
Abstract

A method of background calibration of aperture center errors in a data communication system is provided. In an implementation, in response to detection of a low sampler output ('0') in between two high sampler outputs ('1'), the method includes: determining a direction of an ADC output signal at the time of the detected low output; and adjusting timing at a selected sampler based on the determined signal direction. In an example implementation, the method includes watching for bubbles in the thermometer code output, and estimating the first derivative of the signal at the time of the bubble, then estimating the sign of the errors. In an example implementation, the errors are used in a control loop to reduce the aperture center error.


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