The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2015
Filed:
Apr. 23, 2012
David S Lake, Rochester, MN (US);
Kiaran P Mcgee, Rochester, MN (US);
Armando Manduca, Rochester, MN (US);
Yogesh K Mariappan, Rochester, MN (US);
Richard L Ehman, Rochester, MN (US);
David S Lake, Rochester, MN (US);
Kiaran P McGee, Rochester, MN (US);
Armando Manduca, Rochester, MN (US);
Yogesh K Mariappan, Rochester, MN (US);
Richard L Ehman, Rochester, MN (US);
Mayo Foundation for Medical Education and Research, Rochester, MN (US);
Abstract
A method for calculating a mechanical property of a material using a magnetic resonance imaging ('MRI') system is provided. The method is particularly robust to image data having low signal-to-noise ratio ('SNR'). An MRI system is used to acquire magnetic resonance elastography (“MRE”) data from a subject containing the material. Exemplary materials include lung tissue. Images are reconstructed from the MRE data and used to produce a wave image from which a spatial frequency spectrum is produced. A principal frequency of the spatial frequency spectrum is produced and used to calculate a mechanical property of the material. For example, shear stiffness may be calculated.