The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2015

Filed:

Nov. 12, 2007
Applicants:

James Wayne Bing, Ankeny, IA (US);

Robert F. Cressman, Jr., Wilmington, DE (US);

Manju Gupta, Carmel, IN (US);

Salim M. Hakimi, Sacramento, CA (US);

David Hondred, Altoona, IA (US);

Todd L. Krone, Johnston, IA (US);

Mary E. Hartnett Locke, Mickleton, NJ (US);

Abigail K. Luckring, West Chester, PA (US);

Sandra E. Meyer, Des Moines, IA (US);

Daniel Moellenbeck, Granger, IA (US);

Kenneth Edwin Narva, Zionsville, IN (US);

Paul D. Olson, Kalaheo, HI (US);

Craig D. Sanders, Bear, DE (US);

Jimei Wang, Johnston, IA (US);

Jian Zhang, Urbandale, IA (US);

Gan-yuan Zhong, Urbandale, IA (US);

Inventors:

James Wayne Bing, Ankeny, IA (US);

Robert F. Cressman, Jr., Wilmington, DE (US);

Manju Gupta, Carmel, IN (US);

Salim M. Hakimi, Sacramento, CA (US);

David Hondred, Altoona, IA (US);

Todd L. Krone, Johnston, IA (US);

Mary E. Hartnett Locke, Mickleton, NJ (US);

Abigail K. Luckring, West Chester, PA (US);

Sandra E. Meyer, Des Moines, IA (US);

Daniel Moellenbeck, Granger, IA (US);

Kenneth Edwin Narva, Zionsville, IN (US);

Paul D. Olson, Kalaheo, HI (US);

Craig D. Sanders, Bear, DE (US);

Jimei Wang, Johnston, IA (US);

Jian Zhang, Urbandale, IA (US);

Gan-Yuan Zhong, Urbandale, IA (US);

Assignees:

E.I. DuPont de Nemours and Company, Wilmington, DE (US);

Pioneer Hi-Bred International, Inc., Johnston, IA (US);

Dow Agrosciences LLC, Indianapolis, IN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12N 15/82 (2006.01); C12N 15/11 (2006.01); C07K 14/415 (2006.01); C12Q 1/68 (2006.01);
U.S. Cl.
CPC ...
C07K 14/415 (2013.01); C12N 15/8277 (2013.01); C12N 15/8286 (2013.01); C12Q 1/6895 (2013.01);
Abstract

The invention provides DNA compositions that relate to transgenic insect resistant maize plants. Also provided are assays for detecting the presence of the maize DAS-59122-7 event based on the DNA sequence of the recombinant construct inserted into the maize genome and the DNA sequences flanking the insertion site. Kits and conditions useful in conducting the assays are provided.


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