The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2015

Filed:

Jul. 10, 2009
Applicants:

Masaji Sawa, Saitama, JP;

Naoki Maruno, Saitama, JP;

Masaru Yamana, Hyogo, JP;

Inventors:

Masaji Sawa, Saitama, JP;

Naoki Maruno, Saitama, JP;

Masaru Yamana, Hyogo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K 7/02 (2006.01); H01M 10/00 (2006.01); H01M 10/48 (2006.01); G01K 1/14 (2006.01); G01R 31/02 (2006.01); G01R 31/36 (2006.01);
U.S. Cl.
CPC ...
H01M 10/486 (2013.01); G01K 1/14 (2013.01); G01K 7/02 (2013.01); G01R 31/025 (2013.01); G01R 31/3627 (2013.01);
Abstract

In a prior-art nail puncture test, it has been difficult to measure the temperature at a short-circuiting portion, which is closely related to the scale of an accident which occurs. As a solution, A nail puncture test device having a temperature measurement function, a sheath thermocouple, and a fixing portionof the sheath thermocouple, wherein a bottomed hole through which the sheath thermocouple is inserted is bored in the axial direction from a head portion to the vicinity of the distal end at the center part of the outer frame, and the sheath thermocouple is fixed to the outer frame by the fixing portionin a state where the sheath thermocouple is inserted into the bottomed hole and the distal end thereof having a temperature measurement point is in contact with the bottom of the hole is provided.


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