The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2015

Filed:

Jan. 10, 2012
Applicants:

David L. Williams, Colleyville, TX (US);

Ron Mccullough, Burleson, TX (US);

Inventors:

David L. Williams, Colleyville, TX (US);

Ron McCullough, Burleson, TX (US);

Assignee:

Textron Innovatons Inc., Providence, RI (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/02 (2006.01); G01N 3/04 (2006.01); B23B 31/16 (2006.01);
U.S. Cl.
CPC ...
G01N 3/04 (2013.01); G01N 2203/0023 (2013.01); G01N 2203/0048 (2013.01); G01N 2203/0405 (2013.01); G01N 2203/0435 (2013.01);
Abstract

The test fixture includes a housing, a first grip, and a second grip. The first grip and the second grip are each configured to clamp onto an upper surface and lower surface of a material coupon. The test fixture also includes an upper input jaw and a lower input jaw each configured to clamp onto the material coupon near a center of the upper surface and the lower surface of the material coupon. The test fixture is configured to load the material coupon in a first direction and a second direction. The first grip and the second grip are each configured to clamp onto the material coupon at a location which accordingly results in a desired testing ratio regardless of a variation in thickness of the material coupon.


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