The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 2015
Filed:
Aug. 29, 2011
Jeremy Ray Brown, Orem, UT (US);
Jason Allen Sabin, Lehi, UT (US);
Nathaniel Brent Kranendonk, Springville, UT (US);
Kal A. Larsen, Springville, UT (US);
Lloyd Leon Burch, Payson, UT (US);
Matthew Holt, Provo, UT (US);
Michael John Jorgensen, Mapleton, UT (US);
Michael Fairbanks, Lindon, UT (US);
Chad Buttars, Pleasant Grove, UT (US);
Jeremy Ray Brown, Orem, UT (US);
Jason Allen Sabin, Lehi, UT (US);
Nathaniel Brent Kranendonk, Springville, UT (US);
Kal A. Larsen, Springville, UT (US);
Lloyd Leon Burch, Payson, UT (US);
Matthew Holt, Provo, UT (US);
Michael John Jorgensen, Mapleton, UT (US);
Michael Fairbanks, Lindon, UT (US);
Chad Buttars, Pleasant Grove, UT (US);
Novell, Inc., Provo, UT (US);
Abstract
Techniques for toxic workload mapping are provided. A state of a target workload is recorded along with a configuration and state of an environment that is processing the workload. Micro valuations are taken, via statistical sampling, for metrics associated with the workload and for different combinations of resources within the environment. The sampling taken at micro second intervals. The valuations are aggregated to form an index representing a toxic mapping for the workload within the environment. The toxic mapping is mined, in view of policy, to provide conditions and scenarios that may be deemed problematic within the workload and/or environment.