The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 2015
Filed:
Feb. 08, 2012
Yang Cao, Longmont, CO (US);
Scott M. Dziak, Fort Collins, CO (US);
Nayak Ratnakar Aravind, Lancaster, PA (US);
Richard Rauschmayer, Longmont, CO (US);
Weijun Tan, Longmont, CO (US);
Yang Cao, Longmont, CO (US);
Scott M. Dziak, Fort Collins, CO (US);
Nayak Ratnakar Aravind, Lancaster, PA (US);
Richard Rauschmayer, Longmont, CO (US);
Weijun Tan, Longmont, CO (US);
Agere Systems Inc., Allentown, PA (US);
Abstract
Various embodiments of the present invention provide systems and methods for media defect detection. For example, a media defect detection systems is disclosed that includes a data input derived from a medium, a fast envelope calculation circuit that receives the data input and provides a fast decay envelope value based on the data input, a slow envelope calculation circuit that receives the data input and provides a slow decay envelope value based on the data input, and a media defect detection circuit. The media defect detection circuit receives the slow decay envelope value and the fast decay envelope value, calculates a ratio value of the fast decay envelope value to the slow decay envelope value, and asserts a defect output based at least in part on the comparison of the ratio value to a defect threshold value.