The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2015

Filed:

Jan. 31, 2013
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Inventors:

Hyun Su Chae, Seoul, KR;

Jong Shin Shin, Yongin-si, KR;

Assignee:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G06F 11/00 (2006.01); G01R 31/3177 (2006.01); G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3177 (2013.01); G01R 31/31715 (2013.01);
Abstract

A data receiver device includes a logic unit configured to generate a test pattern signal, receive a test result signal in the test mode, and compare the test pattern signal with the test result signal to perform a test in the test mode. The data receiver further includes a system frequency control circuit configured to multiply a reference clock signal by a multiplication factor received from the logic unit and to output a test clock signal, an output terminal configured to serialize the test pattern signal based on the test clock signal and to output an output signal, and an input terminal configured to recover a data signal and a data clock signal from an input signal based on the output signal, to deserialize the data signal based on the data clock signal, and to output the test result signal to the logic unit.


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