The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2015

Filed:

Jan. 10, 2007
Applicants:

Akihiro Tanaka, Tokyo, JP;

Akio Tajima, Tokyo, JP;

Seigo Takahashi, Tokyo, JP;

Wakako Maeda, Tokyo, JP;

Inventors:

Akihiro Tanaka, Tokyo, JP;

Akio Tajima, Tokyo, JP;

Seigo Takahashi, Tokyo, JP;

Wakako Maeda, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/02 (2006.01); G06F 7/58 (2006.01); H04K 1/00 (2006.01); H04L 9/08 (2006.01);
U.S. Cl.
CPC ...
H04L 9/0852 (2013.01); H04L 9/0838 (2013.01); G06F 7/58 (2013.01);
Abstract

A random number quality control circuit capable of fast control of the level of random number quality is present. When a '0' output section and a '1' output section generate random numbers by individually receiving a random number signal, a random number quality monitor monitors an unbalance between the numbers of “0”s and “1”s. If a deviation from a desired ratio is found, a drive controller controls the reception characteristics of the “0” output section and “1” output section individually so that the deviation will be compensated for. The amount of information intercepted between a sender and a receiver can be reduced by maintaining the mark ratio of shared random numbers at 50%.


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