The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2015

Filed:

Jul. 03, 2012
Applicants:

Grzegorz Kapkowski, Grodzisk Mazowiecki, PL;

Marcin Kaszynski, Warsaw, PL;

Marek M. Stepniowski, Warszawa, PL;

Inventors:

Grzegorz Kapkowski, Grodzisk Mazowiecki, PL;

Marcin Kaszynski, Warsaw, PL;

Marek M. Stepniowski, Warszawa, PL;

Assignee:

General Instrument Corporation, Horsham, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 7/00 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30256 (2013.01); G06F 17/30569 (2013.01); Y10S 707/913 (2013.01);
Abstract

Disclosed are methods and apparatus for correlating metadata from a plurality of different sources. The methods and apparatus may use an order for the data sources. The metadata from each of the data sources may be divided or split into one or more chunks. The metadata from each of the chunks may be filtered and sorted, e.g., to ensure that the metadata relate to the same multimedia content. The metadata chunks from the first data source in the order and the second data source in the order may then be aligned to produce currently aligned metadata. The metadata data chunks from the next data source in the order may then be aligned with the currently aligned metadata to produce new currently aligned metadata. This process may be repeated until the metadata from all of the sources are aligned, thereby providing a set of correlated metadata.


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