The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 2015
Filed:
May. 13, 2010
Olivier Nano, Aachen, DE;
Ivo José Garcia Dos Santos, Aachen, DE;
Tihomir Tarnavski, Redmond, WA (US);
Sebastien Peray, Dueren, DE;
Marcel Tilly, Heinsberg, DE;
Ramkumar Krishnan, Redmond, WA (US);
Olivier Nano, Aachen, DE;
Ivo José Garcia dos Santos, Aachen, DE;
Tihomir Tarnavski, Redmond, WA (US);
Sebastien Peray, Dueren, DE;
Marcel Tilly, Heinsberg, DE;
Ramkumar Krishnan, Redmond, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
Methods, systems, and computer-readable media to analyze a CEP query are disclosed. A particular analysis module is configured to receive data associated with an event flow generated by execution of a CEP query. The data is received from a first analysis module (e.g., in a stack of analysis modules) or from the event flow via a software communication interface. The analysis module is also configured to execute an analysis operation on the data to generate a result. The analysis module can output the result to a second analysis module (e.g., in the stack of analysis modules) or to a user interface via the software communication interface.