The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2015

Filed:

Dec. 15, 2011
Applicants:

Dongsheng Zhang, Fremont, CA (US);

Eugene W. Lee, San Jose, CA (US);

Wei Yao, Shanghai, CN;

Inventors:

Dongsheng Zhang, Fremont, CA (US);

Eugene W. Lee, San Jose, CA (US);

Wei Yao, Shanghai, CN;

Assignee:

Cortina Access, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 10/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

There are disclosed systems and methods for detecting whether an Optical Network Unit (ONU) in a network may be causing a communications interference due to laser overlap. In one embodiment, an Optical Line Terminal (OLT) selects a pair of ONUs suspected of possibly causing laser overlap. The OLT then grants a first window to a first ONU for transmitting a first message, and grants to another ONU different from the pair of ONUs a second window for transmitting a second message. If the first message is not received by the OLT, then the OLT indicates that the first ONU may be causing laser overlap. In another embodiment, the OLT grants to an ONU a window for transmitting a message to the OLT. If the message is not received by the OLT when expected, then the OLT indicates that the ONU may be causing laser overlap. Other embodiments are disclosed.


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