The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2015

Filed:

Jan. 11, 2011
Applicants:

Dong-o Kim, Seoul, KR;

Rae-hong Park, Seoul, KR;

Inventors:

Dong-O Kim, Seoul, KR;

Rae-Hong Park, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/68 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0002 (2013.01); G06T 2207/30168 (2013.01);
Abstract

Provided is a method for assessing image quality using quantization codes, which includes: filtering an original image and a distorted image; generating phase quantization codes from the filtering result; calculating a Hamming difference between the phase quantization code of the original image and the phase quantization code of the distorted image; and assessing image quality of the distorted image by using the calculated Hamming difference. According to the present disclosure, since pixel values of the original image and the distorted image are mapped onto a quantized complex plane and then binary code operation is performed, it is possible to easily implement image quality assessing hardware and also ensure excellent image quality assessing performance.


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