The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 2015
Filed:
May. 31, 2012
Applicants:
Lihui Chen, Thornhill, CA;
Yang Yang, Toronto, CA;
Inventors:
Lihui Chen, Thornhill, CA;
Yang Yang, Toronto, CA;
Assignee:
Seiko Epson Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention uses dynamic grouping to divide up training samples to train different classification nodes. At the beginning of the training, all samples are in the same group. A clustering process is applied in the feature space of the selected feature vectors with cluster indexes accumulated. The average of all the accumulated cluster indexes is used as the threshold for splitting the samples into two groups. When the splitting criterion is met, samples are split into two groups based on their similarity in the feature space.