The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2015

Filed:

Apr. 15, 2011
Applicants:

Vincent Bismuth, Buc, FR;

Regis Vaillant, Buc, FR;

Inventors:

Vincent Bismuth, Buc, FR;

Regis Vaillant, Buc, FR;

Assignee:

General Electric Company, Schenectady, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/20 (2006.01); H04N 5/325 (2006.01); A61M 25/00 (2006.01); A61F 2/95 (2013.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0024 (2013.01); G06T 2207/30101 (2013.01);
Abstract

A method to process radiological images is provided. The method comprises partitioning a radiological image of a region to be treated into a superimposition of layers, the region to be treated comprising at least one first structure and a second structure, wherein one layer solely comprises part of the first structure to be isolated from the remainder of the image, the layer solely comprising that part of the first structure to be isolated from the remainder of the image being determined by means of a parametric model of the first structure. The method further comprises determining an image of the region to be treated from the layering thus obtained, in which the isolated part of the first structure is omitted.


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