The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 2015
Filed:
Sep. 14, 2012
Jun Liu, Plainsboro, NJ (US);
Jeremy Rapin, Paris, FR;
Alban Lefebvre, Jersey City, NJ (US);
Mariappan S. Nadar, Plainsboro, NJ (US);
Ti-chiun Chang, Princeton Junction, NJ (US);
Michael Zenge, Nürnberg, DE;
Edgar Müller, Heroldsbach, DE;
Jun Liu, Plainsboro, NJ (US);
Jeremy Rapin, Paris, FR;
Alban Lefebvre, Jersey City, NJ (US);
Mariappan S. Nadar, Plainsboro, NJ (US);
Ti-chiun Chang, Princeton Junction, NJ (US);
Michael Zenge, Nürnberg, DE;
Edgar Müller, Heroldsbach, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
A method for image reconstruction includes receiving under-sampled k-space data, determining a data fidelity term of a first image of the under-sampled k-space data in view of a second image of the under-sampled k-space data, wherein a time component separated the first image and the second image, determining a spatial penalization on redundant Haar wavelet coefficients of the first image in view of the second image, and optimizing the first image according the data fidelity term and the spatial penalization, wherein the spatial penalization selectively penalizes temporal coefficients and an optimized image of the first image is output.