The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2015

Filed:

Jun. 07, 2010
Applicants:

Evgeny Landa, Lescar, FR;

Reda Baina, Pau, FR;

Inventors:

Evgeny Landa, Lescar, FR;

Reda Baina, Pau, FR;

Assignee:

Total SA, Courbevoie, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01V 1/28 (2006.01);
U.S. Cl.
CPC ...
G06K 9/0063 (2013.01); G01V 1/28 (2013.01); G01V 2210/51 (2013.01);
Abstract

A method for analyzing seismic data by generating a post-migration common image gather in a dip angle domain from measured seismic data; detecting concave features related to reflection events in the common image gather and apexes; filtering out part of the concave features in the common image gather in a vicinity of the detected apexes; applying a hybrid Radon transform to the filtered common image gather to separate residues of the concave features from other image features related to diffraction events; and applying an inverse hybrid Radon transform to an image containing the separated features related to diffraction events to obtain a transformed common image gather in the dip angle domain.


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