The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2015

Filed:

Jun. 04, 2013
Applicants:

Hong Fu Jin Precision Industry (Shenzhen) Co., Ltd., Shenzhen, CN;

Hon Hai Precision Industry Co., Ltd., New Taipei, TW;

Inventor:

Song-Lin Tong, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H02H 7/00 (2006.01); H02H 3/02 (2006.01); G01R 31/40 (2014.01); G01R 31/28 (2006.01); H02M 1/32 (2007.01);
U.S. Cl.
CPC ...
H02H 3/02 (2013.01); G01R 31/40 (2013.01); G01R 31/2839 (2013.01); H02M 1/32 (2013.01);
Abstract

A test device includes a transformer, a loop analyzer, and a protection circuit. The protection circuit includes a control unit, a signal acquisition and amplification unit, and an electronic switch. When the loop analyzer outputs a signal, the signal acquisition and amplification unit acquires the signal output from the loop analyzer, amplifies the acquired signal, and outputs the amplified signal to the control unit. The control unit transforms the received signal from analog form to digital form, and compares the digital signal with a reference value. If the digital signal is greater than the reference value, the control unit outputs a control signal to the electronic switch, to turn off the electronic switch. The signal output from the loop analyzer cannot be transmitted to a buck circuit.


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