The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2015

Filed:

Jun. 27, 2011
Applicants:

Kenji Yamane, Kanagawa, JP;

Naoki Tagami, Tokyo, JP;

Yoshihiro Wakita, Tokyo, JP;

Masato Kajimoto, Chiba, JP;

Inventors:

Kenji Yamane, Kanagawa, JP;

Naoki Tagami, Tokyo, JP;

Yoshihiro Wakita, Tokyo, JP;

Masato Kajimoto, Chiba, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G02B 21/36 (2006.01); G06F 9/50 (2006.01); H04N 19/60 (2014.01); H04N 19/423 (2014.01); H04N 5/225 (2006.01);
U.S. Cl.
CPC ...
G02B 21/365 (2013.01); G06F 9/505 (2013.01); H04N 19/00775 (2013.01); H04N 19/00484 (2013.01); G06F 2209/509 (2013.01);
Abstract

A microscope control device includes a driving control unit that controls driving of a microscope which captures a digital enlarged image of a predetermined sample and outputs the corresponding digital enlarged image to an external server, a digital work processing unit that performs a digital work process for the captured digital enlarged image, a load calculation unit that calculates a load which is necessary for the capturing process of the digital enlarged image, and a digital work determination unit that determines whether or not the predetermined digital work process is to be performed by the digital work processing unit based on a load value calculated by the load calculation unit and a load value for the corresponding server obtained from the server.


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