The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 2015
Filed:
Feb. 13, 2012
Applicants:
Ronald Andrew Michallick, McKinney, TX (US);
Michael Nolan Jervis, McKinney, TX (US);
Rex Warren Pirkle, Denison, TX (US);
Inventors:
Ronald Andrew Michallick, McKinney, TX (US);
Michael Nolan Jervis, McKinney, TX (US);
Rex Warren Pirkle, Denison, TX (US);
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2014.01); G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
In a method of testing integrated circuit devices, a parameter, such as initial voltage may first be measured. A low pass filter operation may be applied to the measured data to generate peer data. A particular integrated circuit device may be identified as failed or rejected when its measured parameter varies sufficiently relative to the peer data.