The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 2015
Filed:
May. 07, 2012
Liang Han, Sunnyvale, CA (US);
Jayesh Nath, Santa Clara, CA (US);
Matthew A. Mow, Los Altos, CA (US);
Peter Bevelacqua, Cupertino, CA (US);
Joshua G. Nickel, San Jose, CA (US);
Mattia Pascolini, Campbell, CA (US);
Robert W. Schlub, Cupertino, CA (US);
Ruben Caballero, San Jose, CA (US);
Liang Han, Sunnyvale, CA (US);
Jayesh Nath, Santa Clara, CA (US);
Matthew A. Mow, Los Altos, CA (US);
Peter Bevelacqua, Cupertino, CA (US);
Joshua G. Nickel, San Jose, CA (US);
Mattia Pascolini, Campbell, CA (US);
Robert W. Schlub, Cupertino, CA (US);
Ruben Caballero, San Jose, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
A test system for characterizing an antenna tuning element is provided. The test system may include a test host, a radio-frequency tester, and a test fixture. The test system may calibrate the radio-frequency tester using known coaxial standards. The test system may then calibrate transmission line effects associated with the test fixture using a THRU-REFLECT-LINE calibration algorithm. The antenna tuning element may be mounted on a test socket that is part of the test fixture. While the antenna tuning element is mounted on the test socket, scattering parameter measurements may be obtained using the radio-frequency tester. An equivalent circuit model for the test socket can be obtained based on the measured scattering parameters and known characteristics of the antenna tuning element. Once the test socket has been characterized, an equivalent circuit model for the antenna tuning element can be obtained by extracting suitable modeling parameters from the measured scattering parameters.