The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2015

Filed:

Sep. 26, 2008
Applicants:

Michel Abs, Bossière, BE;

Szymon Zaremba, Namur, BE;

Willem Kleeven, Pellenberg, BE;

Inventors:

Michel Abs, Bossière, BE;

Szymon Zaremba, Namur, BE;

Willem Kleeven, Pellenberg, BE;

Assignee:

Ion Beam Applications S.A., Louvain-la-Neuve, BE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G21K 1/093 (2006.01); G21K 1/08 (2006.01); A61L 2/08 (2006.01); A61N 5/10 (2006.01); G21K 5/04 (2006.01); G21K 5/10 (2006.01); H05G 2/00 (2006.01); H01J 37/30 (2006.01); H01J 37/317 (2006.01); H01J 37/147 (2006.01); H01J 37/10 (2006.01); H01J 37/304 (2006.01);
U.S. Cl.
CPC ...
G21K 1/08 (2013.01); H01J 37/3005 (2013.01); H01J 37/317 (2013.01); H01J 37/1474 (2013.01); H01J 37/147 (2013.01); H01J 37/10 (2013.01); H01J 37/3045 (2013.01); H01J 37/304 (2013.01); H01J 37/3002 (2013.01); A61L 2/087 (2013.01); A61L 2202/122 (2013.01); A61N 5/1043 (2013.01); A61N 2005/1087 (2013.01); G21K 5/04 (2013.01); G21K 5/10 (2013.01); H01J 2237/31701 (2013.01); H05G 2/00 (2013.01);
Abstract

An apparatus for transporting a charged particle beam is provided. The apparatus may include: means for scanning the charged particle beam on a target, a dipole magnet arranged upstream of the means for scanning, at least three quadrupole lenses arranged between the dipole magnet and the means for scanning, and means for adjusting the field strength of at least three quadrupole lenses in function of the scanning angle of the charged particle beam. The apparatus can be made at least single achromatic.


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