The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2015

Filed:

Jun. 20, 2013
Applicant:

Flir Systems, Inc., Wilsonville, OR (US);

Inventors:

James T. Woolaway, Santa Barbara, CA (US);

John D. Schlesselmann, Goleta, CA (US);

Assignee:

FLIR Systems, Inc., Wilsonville, OR (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 5/02 (2006.01); G01J 1/46 (2006.01); H04N 5/357 (2011.01); H04N 5/363 (2011.01); H04N 5/369 (2011.01); H04N 5/3745 (2011.01);
U.S. Cl.
CPC ...
G01J 1/46 (2013.01); H04N 5/3577 (2013.01); H04N 5/363 (2013.01); H04N 5/3698 (2013.01); H04N 5/37452 (2013.01);
Abstract

Various techniques are disclosed for providing reference signals to image detectors in accordance with one or more embodiments of the invention. For example, in one or more embodiments, switched capacitors may be used to provide bias voltages to individual unit cells of a focal plane array such that the bias voltages are held by the unit cells over one or more integration periods while the unit cells are decoupled from an input line. As a result, the bias voltages may be free from noise incident on the input line and thus may more accurately bias the individual unit cells.


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