The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2015

Filed:

May. 02, 2012
Applicants:

Kosei Noda, Atsugi, JP;

Shunpei Yamazaki, Setagaya, JP;

Tatsuya Honda, Isehara, JP;

Yusuke Sekine, Yamato, JP;

Hiroyuki Tomatsu, Atsugi, JP;

Inventors:

Kosei Noda, Atsugi, JP;

Shunpei Yamazaki, Setagaya, JP;

Tatsuya Honda, Isehara, JP;

Yusuke Sekine, Yamato, JP;

Hiroyuki Tomatsu, Atsugi, JP;

Assignee:

Semiconductor Energy Laboratory Co., Ltd., Atsugi-shi, Kanagawa-ken, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/20 (2006.01); H01L 27/115 (2006.01); H01L 21/84 (2006.01); H01L 27/108 (2006.01); H01L 27/12 (2006.01); H01L 29/66 (2006.01); H01L 29/786 (2006.01); H01L 21/02 (2006.01);
U.S. Cl.
CPC ...
H01L 27/1156 (2013.01); H01L 21/84 (2013.01); H01L 27/10873 (2013.01); H01L 27/1203 (2013.01); H01L 29/66742 (2013.01); H01L 29/78603 (2013.01); H01L 29/7869 (2013.01); H01L 21/0242 (2013.01); H01L 21/02554 (2013.01); H01L 21/02656 (2013.01); H01L 21/02595 (2013.01);
Abstract

A highly reliable transistor which includes an oxide semiconductor and has high field-effect mobility and in which a variation in threshold voltage is small is provided. By using the transistor, a high-performance semiconductor device, which has been difficult to realize, is provided. The transistor includes an oxide semiconductor film which contains two or more kinds, preferably three or more kinds of elements selected from indium, tin, zinc, and aluminum. The oxide semiconductor film is formed in a state where a substrate is heated. Further, oxygen is supplied to the oxide semiconductor film with an adjacent insulating film and/or by ion implantation in a manufacturing process of the transistor, so that oxygen deficiency which generates a carrier is reduced as much as possible. In addition, the oxide semiconductor film is highly purified in the manufacturing process of the transistor, so that the concentration of hydrogen is made extremely low.


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