The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2015

Filed:

Mar. 15, 2013
Applicant:

Lexvu Opto Microelectronics Technology (Shanghai) Ltd, Shanghai, CN;

Inventors:

Zhiwei Wang, Shanghai, CN;

Jianhong Mao, Shanghai, CN;

Fengqin Han, Shanghai, CN;

Lei Zhang, Shanghai, CN;

Deming Tang, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); H01L 31/02 (2006.01); H01L 27/146 (2006.01);
U.S. Cl.
CPC ...
H01L 31/02002 (2013.01); H01L 27/14627 (2013.01); H01L 27/1463 (2013.01); H01L 27/14632 (2013.01); H01L 27/14643 (2013.01); H01L 27/14665 (2013.01);
Abstract

A photosensitive imaging device and a method for forming a semiconductor device are provided. The method includes: providing a first device layer formed on a first substrate, wherein a conductive top bonding pad layer is formed on the first device layer; providing a continuous second device layer formed on a second substrate, wherein a continuous conductive adhesion layer is formed on the continuous second device layer; bonding the first device layer with the second device layer, where the top bonding pad layer on the first device layer is directly connected with the conductive continuous adhesion layer on the continuous second device layer; removing the second substrate; selectively etching the continuous second device and the continuous conductive adhesion layer to form a groove array; and filling up the groove array with an insulation material to form a plurality of second devices. Alignment accuracy may be improved.


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