The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 2015
Filed:
Jan. 06, 2012
Daniel I. Harris, Honeoye Falls, NY (US);
Derek R. Lebzelter, Fairport, NY (US);
John P. Salvador, Penfield, NY (US);
William H. Pettit, Rochester, NY (US);
Akbar Chowdhury, Pittsford, NY (US);
Edward G. Himes, Pittsford, NY (US);
Daniel I. Harris, Honeoye Falls, NY (US);
Derek R. Lebzelter, Fairport, NY (US);
John P. Salvador, Penfield, NY (US);
William H. Pettit, Rochester, NY (US);
Akbar Chowdhury, Pittsford, NY (US);
Edward G. Himes, Pittsford, NY (US);
GM Global Technology Operations LLC, Detroit, MI (US);
Abstract
A system and method for reducing the frequency of stack stand-by mode events, if necessary, as a fuel cell stack ages and experiences lower performance. The method determines an irreversible voltage loss of the fuel cell stack at predetermined time intervals and determines a stack voltage degradation variable based on the irreversible voltage loss. The method also determines if the stack voltage degradation variable indicates that the fuel cell stack will not meet predetermined stack end-of-life voltage requirements and calculates a maximum allowed voltage degradation rate of the fuel cell stack. The method calculates a maximum number of stand-by mode events per unit time that can be allowed to prevent the stack from exceeding the maximum allowed degradation rate and controls the number of stand-by mode events based on the calculated maximum number of stand-by mode events.