The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 2015
Filed:
Mar. 31, 2010
Keisuke Kuwano, Kobe, JP;
Daigo Fukuma, Kobe, JP;
Keisuke Kuwano, Kobe, JP;
Daigo Fukuma, Kobe, JP;
Sysmex Corporation, Kobe-Shi, JP;
Abstract
The present invention is to present a sample analyzer comprising: a first measurement unit; a second measurement unit; a transport unit for transporting a sample container to the first measurement unit and the second measurement unit; and a controller configured to perform operations comprising: obtaining measurement item information indicating a measurement item of the sample contained in the sample container; and controlling the transport unit so as to transport the sample container to the second measurement unit when a first measurement item and a second measurement item different from the first measurement item are indicated in the measurement item information, and controlling the transport unit so as to transport the sample container to the first measurement unit or the second measurement unit when the first measurement item is indicated and the second measurement item is not indicated in the measurement item information.