The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2015

Filed:

Mar. 09, 2007
Applicants:

Akira Tsukamoto, Toda, JP;

Kazuo Saitoh, Kodaira, JP;

Inventors:

Akira Tsukamoto, Toda, JP;

Kazuo Saitoh, Kodaira, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/543 (2006.01);
U.S. Cl.
CPC ...
G01N 33/54326 (2013.01);
Abstract

A magnetic immunoassay system with a mechanism for compensating the direct current residual magnetic field in the vicinity of the specimen measurement position, in a direction perpendicular to the magnetic marker direction of magnetization for the measurement target. This invention reduces the effects of the magnetic field emitted from the unbound magnetic marker due to the residual magnetic field in the specimen solution and detects with high sensitivity the signal of the bound target magnetic marker. The magnetic field at the measurement position is regulated so as to intersect the direction of magnetization of the magnetic marker for the measurement target, in order to make the magnetization direction of the magnetic marker that is unbound due to residual magnetism or remanence in the sample solution, intersect the magnetization direction of the magnetic marker for the measurement target. The signal of the bound target magnetic marker can be therefore measured with high sensitivity since it is isolated from the unbound magnetic marker signal.


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