The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2015

Filed:

Feb. 24, 2014
Applicant:

Flint Hills Scientific, L.l.c., Lawrence, KS (US);

Inventor:

Ivan Osorio, Leawood, KS (US);

Assignee:

Flunt Hills Scientific, LLC, Lawrence, KS (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/02 (2006.01); A61B 5/00 (2006.01); A61N 1/36 (2006.01); A61B 5/0205 (2006.01); A61B 5/0476 (2006.01); A61B 5/11 (2006.01);
U.S. Cl.
CPC ...
A61B 5/4094 (2013.01); A61N 1/36064 (2013.01); A61N 1/36135 (2013.01); A61B 5/7264 (2013.01); A61B 5/02055 (2013.01); A61B 5/0476 (2013.01); A61B 5/1117 (2013.01); A61B 5/1118 (2013.01); A61B 5/4836 (2013.01); A61B 5/742 (2013.01);
Abstract

A method for identifying changes in an epilepsy patient's disease state, comprising: receiving at least one body data stream; determining at least one body index from the at least one body data stream; detecting a plurality of seizure events from the at least one body index; determining at least one seizure metric value for each seizure event; performing a first classification analysis of the plurality of seizure events from the at least one seizure metric value; detecting at least one additional seizure event from the at least one determined index; determining at least one seizure metric value for each additional seizure event, performing a second classification analysis of the plurality of seizure events and the at least one additional seizure event based upon the at least one seizure metric value; comparing the results of the first classification analysis and the second classification analysis; and performing a further action.


Find Patent Forward Citations

Loading…