The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 2015
Filed:
Dec. 14, 2012
The Regents of the University of Colorado, Denver, CO (US);
Robert R. McLeod, Boulder, CO (US);
Michael Cole, Longmont, CO (US);
The Regents of the University of Colorado, Denver, CO (US);
Abstract
Embodiments include methods, systems, and/or devices that may be used to create aberration-corrected gradient index lenses. In some embodiments, data related to aberration measurements is received. This data is processed and an inverse map is generated to compensate for the aberration measurements. An intensity pattern corresponding to the inverse map is then projected onto a blank lens (e.g., to locally polymerize a mobile monomer) to create an exposed lens with a gradient index to correct for the aberration measurement. For example, in some embodiments, the lens may be an intraocular lens and the data can be generated by using a wavefront sensor to measure aberrations (e.g., an optical phase profile to correct defocus or astigmatism) in a patient's eye.