The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 2015
Filed:
May. 21, 2007
Jeff Parrell, Roselle Park, NJ (US);
Boleslaw Czabai, Avenel, NJ (US);
Youzhu Zhang, East Brunswick, NJ (US);
Seungok Hong, New Providence, NJ (US);
Michael Field, Jersey City, NJ (US);
Jeff Parrell, Roselle Park, NJ (US);
Boleslaw Czabai, Avenel, NJ (US);
Youzhu Zhang, East Brunswick, NJ (US);
Seungok Hong, New Providence, NJ (US);
Michael Field, Jersey City, NJ (US);
Oxford Superconducting Technology, Carteret, NJ (US);
Abstract
A device for use as an adjunct in assuring that a manufactured wire is substantially free of internal flaws. A plurality of successively adjacent wire bending stations are provided, where each station includes means for bending the wire into bending planes which are different for each of the stations. The wire is passed through the successive stations, whereby the different bending planes at each station subject the wire at each station to tensile bending strain at portions of the wire cross-section which are different for each station. As a result the probability is increased that a given internal flaw in the wire will be exposed to the tensile bending strain condition as the wire passes through the successive stations, increasing likelihood of breakage of the wire at the flaw or of flaw magnification to improve detection of the flaw during subsequent wire inspections.