The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2015

Filed:

Mar. 30, 2012
Applicants:

David C. Frank, Ossining, NY (US);

Richard E. Harper, Chapel Hill, NC (US);

Jeffrey Lucash, Hurley, NY (US);

Kyung D. Ryu, New City, NY (US);

Ravi A. Shankar, Austin, TX (US);

Thomas Weaver, Dripping Springs, TX (US);

Inventors:

David C. Frank, Ossining, NY (US);

Richard E. Harper, Chapel Hill, NC (US);

Jeffrey Lucash, Hurley, NY (US);

Kyung D. Ryu, New City, NY (US);

Ravi A. Shankar, Austin, TX (US);

Thomas Weaver, Dripping Springs, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/16 (2006.01);
U.S. Cl.
CPC ...
Abstract

An aspect of this invention is a method that includes evaluating a computing environment by performing auditing of a fault tolerance ability of the computing environment to tolerate each of a plurality of failure scenarios; constructing a failover plan for each of the plurality of scenarios; identifying one or more physical resource limitations which constrain the fault tolerance ability; and identifying one or more physical resources to be added to the computing environment to tolerate each of the plurality of failure scenarios.


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