The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2015
Filed:
Jan. 10, 2013
Nec Laboratories America, Inc., Princeton, NJ (US);
NEC Laboratories America, Inc., Princeton, NJ (US);
Abstract
A method for metric ranking in invariant networks includes, given an invariant network and a set of broken invariants, two ranking processes are used to determine and rank the anomaly scores of each monitoring metrics in large-scale systems. Operators can follow the rank to investigate the root-cause in problem investigation. In a first ranking process, given a node/metric, the method determines multiple scores by integrating information from immediate neighbors to decide the anomaly score for metric ranking. In a second ranking process, given a node/metric, an iteration process is used to recursively integrate the information from immediate neighbors at each round to determine its anomaly score for metric ranking.