The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2015
Filed:
Sep. 23, 2011
Bradford Cervenak, Westborough, MA (US);
Yusun Kim Riley, Weston, MA (US);
Uri Baniel, Buffalo Grove, IL (US);
Peter J. Marsico, Chapel Hill, NC (US);
Bradford Cervenak, Westborough, MA (US);
Yusun Kim Riley, Weston, MA (US);
Uri Baniel, Buffalo Grove, IL (US);
Peter J. Marsico, Chapel Hill, NC (US);
Tekelec, Inc., Morrisville, NC (US);
Abstract
Methods, systems, and computer readable media for PCRF fault tolerance are disclosed. One exemplary method for PCRF fault tolerance includes sending, from the PCRF to a Diameter peer, a message concerning Diameter application session state information associated with Diameter application sessions currently or previously managed by the PCRF. The method further includes receiving, by the PCRF, a message from the Diameter peer in response to the message concerning the Diameter application session state information. The method further includes, determining, by the PCRF and based on the response, whether the Diameter application session state information maintained by the PCRF is accurate. The method further includes, in response to determining that the Diameter application session state information maintained by the PCRF is not accurate, requesting, by the PCRF, Diameter application session state information.