The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2015

Filed:

Oct. 25, 2010
Applicants:

Craig A. Jackson, Ortonville, MI (US);

Jonathan H. Owen, Beverly Hills, MI (US);

Inventors:

Craig A. Jackson, Ortonville, MI (US);

Jonathan H. Owen, Beverly Hills, MI (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/10 (2006.01); G06Q 10/06 (2012.01); G05B 17/02 (2006.01); G05B 19/418 (2006.01);
U.S. Cl.
CPC ...
G06Q 10/06 (2013.01); G05B 17/02 (2013.01); G05B 19/4188 (2013.01); G05B 2219/31341 (2013.01);
Abstract

A method for analyzing performance of a manufacturing system includes constructing a descriptive representation of the manufacturing system, selectively binding the descriptive representation to an analytical module using a software isolation layer, invoking the analytical module, and utilizing an output of the analytical module using an end-user application program configured to utilize the output.


Find Patent Forward Citations

Jackson, Craig. (2015). Manufacturing system performance analysis tool software architecture (U.S. Patent No. 8942957). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8942957

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…