The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2015
Filed:
Feb. 01, 2012
Dan Xu, Oconomowoc, WI (US);
Joseph K. Maier, Milwaukee, WI (US);
Kevin F. King, Menomonee Falls, WI (US);
Bruce David Collick, Madison, WI (US);
Dan Xu, Oconomowoc, WI (US);
Joseph K. Maier, Milwaukee, WI (US);
Kevin F. King, Menomonee Falls, WI (US);
Bruce David Collick, Madison, WI (US);
General Electric Company, Schenectady, NY (US);
Abstract
A computer is programmed to acquire calibration data from a calibration scan, the calibration data configured to characterize high order eddy current (HOEC) generated magnetic field error of an imaging system. The computer is also programmed to process the calibration data to generate a plurality of basis coefficients and a plurality of time constants and to calculate a plurality of basis correction coefficients based on the plurality of basis coefficients, the plurality of time constants, and gradient waveforms in a given pulse sequence. The computer is further programmed to execute a diffusion-weighted imaging scan that comprises application of a DW-EPI pulse sequence to acquire MR data from an imaging subject and reconstruction of an image based on the acquired MR data. The computer is also programmed to apply HOEC-generated magnetic field error correction during application of the DW-EPI pulse sequence configured to reduce HOEC-induced distortion in the reconstructed image.