The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2015
Filed:
Jun. 30, 2011
Selaka Bandara Bulumulla, Niskayuna, NY (US);
Laura Sacolick, Munich, DE;
Desmond Teck Beng Yeo, Clifton Park, NY (US);
Seung-kyun Lee, Cohoes, NY (US);
Thomas Kwok-fah Foo, Clifton Park, NY (US);
William Dixon, Clifton Park, NY (US);
Selaka Bandara Bulumulla, Niskayuna, NY (US);
Laura Sacolick, Munich, DE;
Desmond Teck Beng Yeo, Clifton Park, NY (US);
Seung-Kyun Lee, Cohoes, NY (US);
Thomas Kwok-Fah Foo, Clifton Park, NY (US);
William Dixon, Clifton Park, NY (US);
General Electric Company, Schenectady, NY (US);
Abstract
A system and method for determining electrical properties using Magnetic Resonance Imaging (MRI) are provided. One method includes determining a magnitude of an MRI Bfield applied to an object, determining a phase of the MRI Bfield applied to the object and combining the determined magnitude and phase to determine a complex Bfield estimate. The method further includes estimating one or more electrical properties of the object using the complex Bfield estimate by directly solving at least one difference equation.