The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2015
Filed:
Mar. 12, 2012
James Romanelli, Colchester, CT (US);
Jeffrey S. Beattie, South Glastonbury, CT (US);
Jesse R. Boyer, Manchester, CT (US);
Robert E. Erickson, Storrs, CT (US);
Randall W. Joyner, Union, CT (US);
Daniel A. Snyder, Manchester, CT (US);
David A. Krause, Tolland, CT (US);
Kun Tong, West Hartford, CT (US);
James Romanelli, Colchester, CT (US);
Jeffrey S. Beattie, South Glastonbury, CT (US);
Jesse R. Boyer, Manchester, CT (US);
Robert E. Erickson, Storrs, CT (US);
Randall W. Joyner, Union, CT (US);
Daniel A. Snyder, Manchester, CT (US);
David A. Krause, Tolland, CT (US);
Kun Tong, West Hartford, CT (US);
United Technologies Corporation, Hartfod, CT (US);
Abstract
A method is provided for inspecting a plurality of parts with an electronic measurement device and a processing system. The method includes a step of creating surface geometry maps of the parts utilizing the electronic measurement device, where each part was manufactured utilizing the manufacturing device. Geometric part models of the parts are generated from the surface geometry maps. The part models can subsequently be analyzed to determine whether a manufacturing device that manufactured the plurality of parts manufactures parts that comply with a part design specification.