The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2015
Filed:
Dec. 11, 2011
Wei Tan, Shanghai, CN;
Alexander Seth Ross, Albany, NY (US);
Veera Venkata Lakshmi Rajesh Langoju, Bangalore, IN;
Ran Niu, Shanghai, CN;
Zhilin Wu, Shanghai, CN;
Weihua Gao, Shanghai, CN;
Wei Tan, Shanghai, CN;
Alexander Seth Ross, Albany, NY (US);
Veera Venkata Lakshmi Rajesh Langoju, Bangalore, IN;
Ran Niu, Shanghai, CN;
Zhilin Wu, Shanghai, CN;
Weihua Gao, Shanghai, CN;
General Electric Company, Schenectady, NY (US);
Abstract
An iteration method for computing a distribution of one or more properties within an object comprises defining a first mesh of the object, applying an excitation to the object, computing a response of the object to the applied excitation, obtaining a reference response of the object corresponding to the applied excitation, computing a distribution of one or more properties of the object, and updating at least a subset of the nodes of the first mesh to form an updated mesh of the object. The distribution of one or more properties of the object is computed using the computed response, the reference response, and the first mesh. The first mesh includes a plurality of nodes and elements. A connectivity relationship of the subset of the nodes in the updated mesh remains the same as in the first mesh.